XRD, STA & Electron microscopy

XRD, STA & Electron microscopy

xrd

The MTC has an x-ray diffractometer (XRD), a simultaneous thermal analysis (STA) system and access to a transmission electron microscope and a scanning electron microscope. As such the following analyses are possible.

  • Phase identification of powders and solid materials on the XRD.
  • Rietveld refinements of scans on the XRD.
  • Retained Austenite measurements.
  • Thermal analysis of materials.
  • Imaging and EDX analysis of composition on the SEM.
  • EDX mappings.
  • Electron Backscatter diffraction analysis.
  • TEM imaging.
  • STEM imaging.
  • EDX point analysis and EDX mappings on the TEM.