XRD, STA & Electron microscopy
The MTC has an x-ray diffractometer (XRD), a simultaneous thermal analysis (STA) system and access to a transmission electron microscope and a scanning electron microscope. As such the following analyses are possible.
- Phase identification of powders and solid materials on the XRD.
- Rietveld refinements of scans on the XRD.
- Retained Austenite measurements.
- Thermal analysis of materials.
- Imaging and EDX analysis of composition on the SEM.
- EDX mappings.
- Electron Backscatter diffraction analysis.
- TEM imaging.
- STEM imaging.
- EDX point analysis and EDX mappings on the TEM.